document: Self-testing chips take a load off ATE Looks at how chipmakers get more life out of automatic test equipment by embedding innovative circuits in silicon
doc_bio_tags: O O O O O O B O O O O O O O O O B I I O O B I O O
extractive_keyphrases: ate automatic test equipment innovative circuits
abstractive_keyphrases: self-testing chips design-for-test techniques embedded deterministic testing technique